NX-Wafer 半導體用全自動機台
1. 適用於bare wafer , pattern wafer for 8” or 12”
2. Surface roughness , trench depth, critical angle measurement , line width 等量測.
可擴充Long range profiler , Automatic Tips exchange , automatic Wafer Handler , Ionization system
E-mail: advasi@ms4.hinet.net
http://www.advantage.com.tw 聯絡我們 Design By Tw17! 台灣儀器網